Sample Preparation tips

FIB Lamella

One of the most crucial applications of a focused ion beam (FIB) is preparing and transferring lamellae for transmission electron microscopy (TEM) investigations. Typically, sample preparation using a FIB is a very time-consuming and risky procedure.
This technique decreases preparation time, while diminishing the risks involved during thinning and transferring of the lamella.

Graphene Transfer

Specially designed technique for graphene transfer onto our Nano-Chips.

Nanoparticles / Powders

For nanoparticle and crushed powder samples, simply pipette the solution directly onto the microheater spiral of the Nano-Chip.

Thin Film

Using a thin film sputtering deposition device, place your Nano-Chip above your sputtering target and deposit the gas into the device.

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Contact us

Feel free to contact us with any further questions.

Request a Demo or Quote

Request a quotation or demonstration at your lab.