Publications

A Versatile MEMS-Based In Situ SEM Holder for heating, biasing, and Correlative Microstructural Characterization

Written by Merijn | Jul 25, 2025, 12:00:00 PM

Authors: Yevheniy Pivak, Christian Deen-van Rossum, Mia Andersen, Merijn Pen, Shibabrata Basak, Rüdiger-A Eichel, Hugo Pérez Garza

Journal: Microscopy and Microanalysis · Impact Factor: 30.4