Publications

Complexities in Electron Beam Induced Current (EBIC) Image Formation in Low-Impedance Specimens

Written by Merijn | Jul 25, 2025, 12:00:00 PM

Authors: B Gil, F E Camino, A Rúa, K Kisslinger, M G Han, D C Hayes, J Alban, R Agrawal, M Kim, Y Zhu, J C Yang

Journal: Microscopy and Microanalysis · Impact Factor: 30.4