Eighth Conference on Frontiers of Aberration Corrected Electron Microscopy at Kasteel Vaalsbroek in the Netherlands, 21–25 April 2024

Authors: Joachim Mayer, Carsten Sachse, Rafal Dunin-Borkowski

Journal: Microscopy and Microanalysis · Impact Factor: 2.9

DOI: https://doi.org/10.1093/mam/ozaf007