Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object

Authors: F. Lin, X.B. Ren,Zhou L.Y. Zhang, Y. Xiao, Q. Zhang, H.T. Xu, H. Li,C.H. Jin

Journal: Micron

DOI: https://doi.org/10.1016/j.micron.2018.07.001