Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object

Authors: F.Lin, X.B.Ren,Zhou L.Y.Zhang, Y.Xiao, Q.Zhang, H.T.Xu, H.Li,C.H.Jin

Journal: Micron · Impact Factor: 1.530

DOI: https://www.sciencedirect.com/science/article/abs/pii/S0968432818301707