Publications

FIB based fabrication of an operative Pt/HfO2/TiN device for resistive switching inside a transmission electron microscope

Written by Merijn | Apr 14, 2017, 12:00:00 PM

Authors: A. Zintler, U. Kunz, Y. Pivak, S.U. Sharath, S. Vogel, E. Hildebrandt, H.-J. Kleebe, L. Alff, L. Molina-Luna

Journal: Ultramicroscopy · Impact Factor: 2.644