Authors: Wiebke Albrecht, Arjen van de Glind, Hideto Yoshida, Yusuke Isozaki, Arnout Imhof, Alfons van Blaaderen, Petra E. de Jongh, Krijn P. de Jong, Jovana Zečević, Seiji Takeda
Journal: Ultramicroscopy
DOI: https://doi.org/10.1016/j.ultramic.2018.05.006