In situ electrical characterization of tapered InAs nanowires in a transmission electron microscope with ohmic contacts

Authors: Chao Zhang, Mariya Neklyudova, Liang Fang, Qiang Xu, Hui Wang, Frans D Tichelaar, Henny W Zandbergen

Journal: Nanotechnology

DOI: https://doi.org/10.1088/0957-4484/26/15/155703