In situ transmission electron microscopy of resistive switching in thin silicon oxide layers.

Authors: Martial Duchamp, Vadim Migunov, Amir H. Tavabi, Adnan Mehonic, Mark Buckwell, Manveer Munde, Anthony J. Kenyon, Rafal E. Dunin-Borkowski

Journal: Resolution and Discovery

DOI: https://doi.org/10.1556/2051.2016.00036