Publications

In situ transmission electron microscopy of resistive switching in thin silicon oxide layers

Written by Merijn | Nov 1, 2016, 12:00:00 PM

Authors: Martial Duchamp, Vadim Migunov, Amir H. Tavabi, Adnan Mehonic, Mark Buckwell, Manveer Munde, Anthony J. Kenyon, Rafal E. Dunin-Borkowski

Journal: Resolution and Discovery