In situ transmission electron microscopy study of the formation and migration of vacancy defects in atomically thin black phosphorus

Authors: Fenfa Yao, Yongqing Cai, Zhangru Xiao, Gang Zhang, Rong-Jun Xie and Chuanhong Jin

Journal: 2D Materials

DOI: https://doi.org/10.1088/2053-1583/abce09