Rapid Tomography in Environmental TEM: How Fast Can We Go to Follow the 3D Evolution of Nanomaterials in situ?

Authors: Roiban, L., Koneti, S., Tran, K., Feng, Y. M., Grenier, T., Maxim, V., & Epicier, T.

Journal: Microscopy and Microanalysis

DOI: https://doi.org/10.1017/s143192761601206x