Real-Time TEM Observation of the Role of Defects on Nickel Silicide Propagation in Silicon Nanowires

Authors: Temilade Esther Adegoke, Raman Bekarevich, Hugh Geaney, Sergey Belochapkine, Ursel Bangert, Kevin M. Ryan

Journal: ACS Nano · Impact Factor: 17.40

DOI: https://doi.org/10.1021/acsnano.4c01060