Publications

Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Written by Merijn | Jan 1, 2019, 12:00:00 PM

Authors: Bastian Stelzer, Xiang Chen, Pascal Bliem, Marcus Hans, Bernhard Völker, Rajib Sahu, Christina Scheu, Daniel Primetzhofer, Jochen M. Schneider

Journal: Scientific Reports