Study of Ferroelectric Phases in HfZrOx Thin Films with Varying La Content Using Precession Electron Diffraction & In-Situ heating- biasing Techniques

Authors: Pradyumna Kumar Parida, Paola Favia, Olivier Richard, Gourab De, Mihaela Ioana Popovici, Eva Grieten

Journal: Microscopy and Microanalysis · Impact Factor: 30.4

DOI: https://doi.org/10.1093/mam/ozaf048.588