Authors: Hanglong Wu, Teng Li, Sai P. Maddala, Zafeiris J. Khalil, Rick R. M. Joosten, Brahim Mezari, Emiel J. M. Hensen, Gijsbertus de With, Heiner Friedrich, Jeroen A. van Bokhoven, Joseph P. Patterson
Journal: ACS Nano
DOI: https://doi.org/10.1021/acsnano.1c02461