Authors: William J. Cull, Stephen T. Skowron, Ruth Hayter, Craig T. Stoppiello, Graham A. Rance, Johannes Biskupek, Zakhar R. Kudrynskyi, Zakhar D. Kovalyuk, Christopher S. Allen, Thomas J. A. Slater, Ute Kaiser, Amalia Patanè, Andrei N. Khlobystov
Journal: ACS Nano
DOI: https://pubs.acs.org/doi/10.1021/acsnano.3c00670