Thermally propagated Al contacts on SiGe nanowires characterized by electron beam induced current in a scanning transmission electron microscope

Authors: Aidan P Conlan, Minh Anh Luong, Pascal Gentile, Grigore Moldovan, Martien I Den Hertog, Eva Monroy and David Cooper

Journal: Nanotechnology

DOI: https://doi.org/10.1088/1361-6528/ac2e73