Publications

MEMS-based sample carriers for simultaneous heating and biasing experiments: A platform for in-situ TEM analysis

Written by Merijn | Jun 1, 2017, 12:00:00 PM

Authors: Héctor Hugo Pérez Garza, Yevheniy Pivak, Leopoldo Molina Luna, J. Tijn van Omme, Ronald G. Spruit, Mariya Sholkina, Merijn Pen and Qiang Xu

Journal: Conference: 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)