MEMS-based sample carriers for simultaneous heating and biasing experiments: A platform for in-situ TEM analysis

Lightning June 1, 2017

Authors: Héctor Hugo Pérez Garza, Yevheniy Pivak, Leopoldo Molina Luna, J. Tijn van Omme, Ronald G. Spruit, Mariya Sholkina, Merijn Pen and Qiang Xu

Journal: Conference: 2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)

DOI: https://www.researchgate.net/publication/319029628_MEMS-based_sample_carriers_for_simultaneous_heating_and_biasing_experiments_A_platform_for_in-situ_TEM_analysis

Lightning, App: Other

MEMS-based sample carriers for simultaneous heating and biasing experiments: A platform for in-situ TEM analysis

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