Related Publications

Core–shell reconfiguration through thermal annealing in FexO/CoFe2O4 ordered 2D nanocrystal arrays
Wildfire Jan 9, 2014

Core–shell reconfiguration through thermal annealing in FexO/CoFe2O4 ordered 2D nanocrystal arrays

Core–shell reconfiguration through thermal annealing in FexO/CoFe2O4 ordered 2D nanocrystal arrays. Published in Nanotechnology (I…

Read more
Reversible transformation between terrace and step sites of Pt nanoparticles on titanium under CO and O2 environments
Catalysis Jun 24, 2022

Reversible transformation between terrace and step sites of Pt nanoparticles on titanium under CO and O2 environments

Reversible transformation between terrace and step sites of Pt nanoparticles on titanium under CO and O2 environments. Published i…

Read more
Robust and Coke-free Ni Catalyst Stabilized by 1–2 nm-Thick Multielement Oxide for Methane Dry Reforming
Catalysis Sep 23, 2021

Robust and Coke-free Ni Catalyst Stabilized by 1–2 nm-Thick Multielement Oxide for Methane Dry Reforming

Robust and Coke-free Ni Catalyst Stabilized by 1–2 nm-Thick Multielement Oxide for Methane Dry Reforming. Published in ACS Catalys…

Read more

Related Publications

Relaxor behavior in rocksalt cation-ordered material induced by (anti)ferroelectric phase competition
Lightning Arctic Jun 23, 2026

Relaxor behavior in rocksalt cation-ordered material induced by (anti)ferroelectric phase competition

Relaxor ferroelectrics are characterized by dispersion of the temperature-dependent dielectric constant with frequency and enhance…

Read more
Advanced Electron Microscopy of Clusters Grown Inside Superfluid Helium Droplets: Advances, Challenges, and Perspectives
Wildfire Feb 19, 2026

Advanced Electron Microscopy of Clusters Grown Inside Superfluid Helium Droplets: Advances, Challenges, and Perspectives

Superfluid helium nanodroplets act as ultracold, nanoscale “cryostats” that enable the synthesis of exceptionally pure metallic, b…

Read more
In-Operando 4D-STEM and STEM-EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions
Lightning Feb 9, 2026

In-Operando 4D-STEM and STEM-EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions

ABSTRACT Electronic devices are shrinking, and scanning transmission electron microscopy is essential for the characterization of …

Read more