Sample Preparation

FIB Stub

Improved focused ion beam lamella preparation

DENSsolutions now introduces the FIB stub enables you to prepare a lamella and place it directly on your chip, all inside the FIB. Many improvements were made to make your sample preparation easier, safer and quicker.

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Why the FIB Stub

5 reasons to get the FIB Stub

The FIB stub sets a high standard for focused ion beam lamella preparation on MEMS-based chips.

01

Ease of use

The sample is located on an additional flat side of the stub. This ensures a conventional geometry and the very same well-known process used by any FIB operator.
Ease of use
02

Improved imaging

Reduced shadowing improves the imaging quality, especially at low accelerating voltages during final milling and polishing steps (1ΓÇô5 kV). The charging is also minimized, further improving the quality of the images and the samples.
03

Smart clamping

Due to a dedicated pocket for the Nano-Chips with an integrated end-stop and a smart clamp mechanism, loading and unloading of the chip becomes a simple and fast process. There is no need to use sticky tapes to fix the chip and the possibility to damage the fragile window membranes when handling the chips is greatly reduced.
04

Safe procedure

The stub is engineered in such a way that the position of the sample and the Nano-Chip are on the same height. This minimizes the possibility of crashing into the pole piece, the gas injection system or the manipulator.
Safe procedure
05

High level of compatibility

The FIB stub is compatible with Thermo Fisher Scientific/FEI and JEOL focused ion beam microscopes. For compatibility with Zeiss, Tescan and Hitachi FIBs, please contact us. The FIB stub can be used with all double tilt (Wildfire/Lightning) heating and/or biasing TFS/FEI or JEOL Nano-Chips.
High level of compatibility

See it in action

Watch the complete procedure

See how the FIB Stub simplifies lamella preparation from start to finish.

Testimonials

What researchers say

I still am quite amazed by what the new FIB stub provides. The FIB stub allows to use the established routines on completely new MEMS sample carriers as a simple plug-in stage for the FIB system. No additional stage or sample exchanges need to be performed on the FIB, which saves time and prevents sample degradation.
M.Sc. Alexander Zintler
M.Sc. Alexander Zintler Advanced Electron Microscopy (AEM), TU Darmstadt
The new DENS stub is very useful when making samples for in situ TEM heating and biasing experiments. The refined copper clamping system makes it easy to mount the chip in a safe way, while it is grounded at the same time to prevent charging. By using the angle of 45 degrees it is possible to finish a complete sample in one go without the system having to be aerated. So I am also very satisfied with this stub that makes work easier for me.
M.Sc. Stijn van den Broeck
M.Sc. Stijn van den Broeck Electron Microscopy for Materials Science (EMAT), University of Antwerp

Resources

Brochure

Download the FIB Stub brochure

Download the FIB Stub brochure

For more information on workflow, compatibility and specifications.

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Ready to improve your sample prep?

Contact our team to discuss your needs and receive a tailored quote for the FIB Stub.

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