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Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope

Lightning

Authors: Martial Duchamp, Qiang Xu, Rafal E Dunin-Borkowski

Journal: Microscopy and Microanalysis

DOI: https://doi.org/10.1017/s1431927614013476

Abstract

A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.
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