FIB Lamella
One of the most crucial applications of a focused ion beam (FIB) is preparing and transferring lamellae for transmission electron microscopy (TEM) investigations. Typically, sample preparation using a FIB is a very time-consuming and risky procedure.
This technique decreases preparation time, while diminishing the risks involved during thinning and transferring of the lamella.
Graphene Transfer
Specially designed technique for graphene transfer onto our Nano-Chips.
This method ensures clean and reliable transfer of 2D materials such as graphene onto MEMS-based devices, enabling high-quality in situ TEM experiments.
Nanoparticles / Powders
For nanoparticle and crushed powder samples, simply pipette the solution directly onto the microheater spiral of the Nano-Chip.
This drop-casting method is the most straightforward way to prepare your sample for in situ heating experiments.
Thin Film
Using a thin film deposition device, place your Nano-Chip in the sputtering chamber and deposit the film onto the device.
This sputtering technique allows you to deposit a controlled thin film layer directly onto the MEMS microheater for reliable in situ experiments.
